Destruction Rate Analysis of CMOS Logic IC under the Condition of Various Pulse and PRF

초록

The logic ICs based on the CMOS are becoming miniaturization, low power consumption and high integration due to advances in technology. However, these factors have very weak characteristics under the Electromagnetic environment. The vulnerability of the logic IC (Integrated Circuit) in accordance with pulse current injection and PRF-(Pulse repetition frequency) was estimated by the Pulse injection test. Device destruction was more influenced by the PRF in low voltages. As the voltage increase, device destruction is more influenced by the pulse voltage.