The Dielectric Properties of Organic Light Emitting Diode thin films at GHz and THz Frequencies

초록

Characterization of the dielectric and optical properties of organic light emitting diode (OLED) thin films is fundamental for applications in opto-electronic devices. THz time-domain spectroscopy provides a new non-destructive tool to characterize the dielectric properties of thin films at low frequency, GHz to THz. The dielectric properties of OLED thin films are investigated at GHz and THz frequencies. A coherent THz wave source and electro-optic detection method are used for the experiment. The measured dielectric properties of the OLED thin films are analyzed and compared with those in visible region.