Thermal Modeling of Power Semiconductor Based on Loss-Temperature Data Measurement

초록

This paper proposes a method for estimating the thermal impedance of power semiconductors using precisely controlled conduction losses. The designed conduction loss generator applies sinusoidal losses with accurate frequency and phase, and the temperature response of power semiconductor is measured for the thermal model estimation. The proposed method enables loss-temperature impedance extraction in the frequency domain, which can be converted to the well-known Foster thermal network.