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Improving Flaw Detection in LCD Manufacturing using GAN-Augmented Data
- 제목
- Improving Flaw Detection in LCD Manufacturing using GAN-Augmented Data
- 저자
- BYUNG SEOK SHIN
- 학회명
- The 9th International Conference on Next Generation Computing (ICNGC 2023)
- 개최지
- 다낭 Duy Tan University
- 학회 개최일
- 2023-12-20 ~ 2023-12-23