Performance of the prototype beam drift chamber for LAMPS at RAON with proton and 12C beams

Kim, H.; Bae, Y.; Heo, C.; Seo, J.; Hwang, J.; Moon, D. H.; Ahn, D. S.; Ahn, J. K.; Bae, J.; Bok, J.; Cheon, Y.; Choi, S. W.; Do, S.; Hong, B.; Hong, S. -w.; Huh, J.; Hwang, S.; Jang, Y.; Kang, B.; Kim, A.; Kim, B.; Kim, C.; Kim, G.; Kim, J.; Kim, S. H.; Kim, Y.; Kim, Y. J.; Kweon, M.; Lee, C.; Lee, H.; Lee, J.; Lee, J. -w.; Lee, S. H.; Lee, S.; Lim, S.; Nam, S. H.; Park, J.; Shin, T.; Kim, E. -j.

doi:10.1088/1748-0221/19/12/P12008

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Performance of the prototype beam drift chamber for LAMPS at RAON with proton and 12C beams

Kim, H.;
Bae, Y.;
Heo, C.;
Seo, J.;
Hwang, J.;
... Kweon, M.;
외 33명

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초록

Beam Drift Chamber (BDC) is designed to reconstruct the trajectories of incident rare isotope beams provided by RAON (Rare isotope Accelerator complex for ON-line experiments) into the experimental target of LAMPS (Large Acceptance Multi-Purpose Spectrometer). To conduct the performance test of the BDC, the prototype BDC (pBDC) is manufactured and evaluated with the high energy ion beams from HIMAC (Heavy Ion Medical Accelerator in Chiba) facility in Japan. Two kinds of ion beams, 100 MeV proton, and 200 MeV/u 12C, have been utilized for this evaluation, and the track reconstruction efficiency and position resolution have been measured as the function of applied high voltage. This paper introduces the construction details and presents the track reconstruction efficiency and position resolution of pBDC.

키워드

Particle tracking detectors (Gaseous detectors); Wire chambers (MWPC, Thin-gap chambers, drift chambers, drift tubes, proportional chambers etc); Beam-line instrumentation (beam position and profile monitors, beam-intensity monitors, bunch length monitors); Gaseous detectors; ACCEPTANCE MULTIPURPOSE SPECTROMETER

제목: Performance of the prototype beam drift chamber for LAMPS at RAON with proton and 12C beams

저자: Kim, H.; Bae, Y.; Heo, C.; Seo, J.; Hwang, J.; Moon, D. H.; Ahn, D. S.; Ahn, J. K.; Bae, J.; Bok, J.; Cheon, Y.; Choi, S. W.; Do, S.; Hong, B.; Hong, S. -w.; Huh, J.; Hwang, S.; Jang, Y.; Kang, B.; Kim, A.; Kim, B.; Kim, C.; Kim, G.; Kim, J.; Kim, S. H.; Kim, Y.; Kim, Y. J.; Kweon, M.; Lee, C.; Lee, H.; Lee, J.; Lee, J. -w.; Lee, S. H.; Lee, S.; Lim, S.; Nam, S. H.; Park, J.; Shin, T.; Kim, E. -j.

DOI: 10.1088/1748-0221/19/12/P12008

발행일: 2024-12

유형: Article

저널명: Journal of Instrumentation

권: 19

호: 12