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All-Sputter-Deposited Hf0.5Zr0.5O2 Double-Gate Ferroelectric Thin-Film Transistor With Amorphous Indium-Gallium-Zinc Oxide Channel
- Jeong, Soi;
- Han, Changhyeon;
- Yim, Jiyong;
- Kim, Jeonghan;
- Kwon, Ki Ryun;
- ... Choi, Rino;
- 외 4명
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15SCOPUS
16초록
Double-Gate ferroelectric thin-film transistor (DG-FeTFT) with an amorphous indium-gallium-zinc oxide (alpha-IGZO) channel is demonstrated. DG-FeTFT is composed of all-sputter-deposited thin films and the bottom FeTFT (FeTFTbottom) and top conventional TFT (TFTtop) are com-bined into a single device that shares the alpha-IGZO channel and source/drain. Through the separation of read (by TFTtop) and program/erase (by FeTFTbottom) operations, it is confirmed that wide memory window (MW) of similar to 5V is obtained with an MW amplification and read disturbance can be significantly improved. Furthermore, it is verified that faster program/erase speeds are achievable by mod-ulating the gate voltage of TFTtop, leading to the improved endurance characteristics.
키워드
- 제목
- All-Sputter-Deposited Hf0.5Zr0.5O2 Double-Gate Ferroelectric Thin-Film Transistor With Amorphous Indium-Gallium-Zinc Oxide Channel
- 저자
- Jeong, Soi; Han, Changhyeon; Yim, Jiyong; Kim, Jeonghan; Kwon, Ki Ryun; Kim, Sangwoo; Park, Eun Chan; You, Ji Won; Choi, Rino; Kwon, Daewoong
- 발행일
- 2023-05
- 유형
- Article
- 권
- 44
- 호
- 5
- 페이지
- 749 ~ 752