All-Sputter-Deposited Hf0.5Zr0.5O2 Double-Gate Ferroelectric Thin-Film Transistor With Amorphous Indium-Gallium-Zinc Oxide Channel

  • Jeong, Soi
  • Han, Changhyeon
  • Yim, Jiyong
  • Kim, Jeonghan
  • Kwon, Ki Ryun
  • ... Choi, Rino
  • 외 4명
Citations

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15
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SCOPUS

16

초록

Double-Gate ferroelectric thin-film transistor (DG-FeTFT) with an amorphous indium-gallium-zinc oxide (alpha-IGZO) channel is demonstrated. DG-FeTFT is composed of all-sputter-deposited thin films and the bottom FeTFT (FeTFTbottom) and top conventional TFT (TFTtop) are com-bined into a single device that shares the alpha-IGZO channel and source/drain. Through the separation of read (by TFTtop) and program/erase (by FeTFTbottom) operations, it is confirmed that wide memory window (MW) of similar to 5V is obtained with an MW amplification and read disturbance can be significantly improved. Furthermore, it is verified that faster program/erase speeds are achievable by mod-ulating the gate voltage of TFTtop, leading to the improved endurance characteristics.

키워드

HfO2-based ferroelectric memoryIGZO ferroelectric thin-film transistors (FeTFT)double-gate FeTFTVOLTAGE
제목
All-Sputter-Deposited Hf0.5Zr0.5O2 Double-Gate Ferroelectric Thin-Film Transistor With Amorphous Indium-Gallium-Zinc Oxide Channel
저자
Jeong, SoiHan, ChanghyeonYim, JiyongKim, JeonghanKwon, Ki RyunKim, SangwooPark, Eun ChanYou, Ji WonChoi, RinoKwon, Daewoong
DOI
10.1109/LED.2023.3260860
발행일
2023-05
유형
Article
저널명
IEEE Electron Device Letters
44
5
페이지
749 ~ 752