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초록
We have set up the Optical Low-Coherence Interferometer system for characterization of optical wires for Optical-Printed Circuit Board and optical components. We measured various characteristics such as polarization dependency and propagating loss by measuring the back scattered light from the inside of optical waveguide and optical device
- 제목
- 저가간섭 간섭계를 이용한 광 도파로 특성 평가
- 제목 (타언어)
- Measurement of Optical Wires using Optical Low-Coherence
- 저자
- LEE EL HANG
- 학회명
- 한국광학회 (대명콘도 대명), Photonic Conference 2004