The Susceptibility of Microcontroller Device with Coupling Caused by UWB-HPEM

초록

Modrn electronic circuits are of importance for the function of communication, traffic systems and security systems. An intentional threat to these systems could be of big casualties and economic disasters. This paper examined damage effect of microcontroller device with coupling caused by UWB-HPEM (Ultra Wideband-High Power Electomagnetic). The UWB measurements were done at na Anechoic Chamber using a RADAN UWB voltage source, which can generate a transient impulse of about 180kV. The susceptibility level for microcontroller has been assessed by field strength. The failure modes were observed in microcontroller. The A type of malfunction is recovered to original functions by power supply on/offwhen the amplitude of the electromagnetic pulse increases by about 4 times.