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Study on Residual Stress Effects of a Diaphragm for Stainless Steel MEMS Devices
초록
Residual stress effects of stainless steel have been studied as a diaphragm and a substrate material for the MEMS sensors and actuators. In the study, a fabrication process for stainless steel micro machined devices was performed on the membrane and substrate at the environment of 8.65MPa pressure and 175℃ for half an hour and then subsequently cooled down to 25℃. The finite element method is adopted to investigate the residual stresses formed in the process. Besides, out-of-plane deflections were also calculated under pressures on the diaphragm.
- 제목
- Study on Residual Stress Effects of a Diaphragm for Stainless Steel MEMS Devices
- 저자
- CHO CHONG DU
- 학회명
- the 4th Korean-Sino Conference on Advanced Manufacturing Technology