백색광 간섭계를 이용한 넓은 파장 영역에서의 연속적인 위상 굴절률 측정

초록

This paper reports a new simple method of measuring the absolute values of phase refractive index of an optical material of flat plate shape over a wide spectral range at a single measurement run. A white light interferometric technique with angle rotation of the optical plate sample located in one of the interferometer arms was used in this method. The validity of this method was proved by measuring the absolute phase refractive indices of flat plate samples of fused silica, and by comparing them with calculated values from their well-known Sellmeier dispersion formulae.