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Atomistic study of the bending properties of silicon nanowires
- Zhuo, X. R.;
- Beom, H. G.
WEB OF SCIENCE
21SCOPUS
21초록
Molecular dynamics simulations are conducted to investigate the mechanical properties and deformation mechanism of silicon nanowires (SiNWs) under pure bending, with a focus on the effects of nanowire diameter, orientation, and cross-sectional shape. The results show that the nanowire diameter and cross-sectional shape do not influence the yield mechanism but the orientation does. In contrast to [1 0 0] and [1 1 0] SiNWs whose yield mechanism is dislocation nucleation, [1 1 1] SiNWs yield by a direct crystal-to-amorphous transition. Moreover, the activated slip plane for [1 0 0] and [1 1 0] SiNWs is different, i.e., {1 1 0} and {1 1 1} plane for [1 0 0] and [1 1 0] SiNWs, respectively. The Young's modulus of [1 0 0] and [1 1 1] SiNWs is dependent on the nanowire diameter and cross-sectional shape, whereas that of [1 1 0] SiNWs is insensitive to these factors. Furthermore, only the nanowire orientation and cross-sectional shape influence the critical bending strain of [1 0 0] and [1 1 1] SiNWs. The results presented in this work may provide valuable information for the design of nano-devices based on SiNWs.
키워드
- 제목
- Atomistic study of the bending properties of silicon nanowires
- 저자
- Zhuo, X. R.; Beom, H. G.
- 발행일
- 2018-09
- 유형
- Article
- 권
- 152
- 페이지
- 331 ~ 336