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초록
An inductively coupled plasma(ICP) of C4F8/Ar/Cl2 gas mixture was used to etch Pt electrode of SAW filters. Photoresist was employed for patterning of Pt which was sputter-deposited on LiTaO3 substrates. By adjusting the gas mixture ratio, sidewall angle of Pt line was larger than 80° without using hard mask, and there was no residues after etching. Fabricated SAW filters were measured in terms of frequency response.
- 제목
- 표면탄성파 필터용 Pt 전극의 C4F8/Ar/Cl2 plasma Pt 식각
- 제목 (타언어)
- 영문제목
- 저자
- LEE EL HANG
- 학회명
- 한국반도체산업협회, 한국반도체학술대회, 2004년 02월