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Collaborative intelligent Labeling System for Classifying Wafer Bin Maps for Improving Electrical Die Sorting Process
- 제목
- Collaborative intelligent Labeling System for Classifying Wafer Bin Maps for Improving Electrical Die Sorting Process
- 저자
- KANG SUNG WOO
- 학회명
- 6th IEEE International Conference on Knowledge Innovation and Invention 2023
- 개최지
- Sapporo
- 학회 개최일
- 2023-08-11 ~ 2023-08-13