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Robust Breakdown Characteristics of High Side LDMOS Device

  • WON TAEYOUNG
제목
Robust Breakdown Characteristics of High Side LDMOS Device
저자
WON TAEYOUNG
학회명
International Conference on Nano Science and Nano Technology
개최지
광주과학기술원 오룡관
학회 개최일
2010-11-08 ~ 2010-11-09

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