고출력 과도 전자파 커플링 효과에 의한 microcontroller의 민감성

초록

We investigated the malfunction and destruction characteristics of microcontroller devices under high power electromagnetic (HPEM) impact by magnetron. HPEM was rated at a microwave output of 0 to 1,000 W, at a frequency of 2.45 GHz and was radiated from the open-ended standard rectangular waveguide (WR-340) to free space. The influence of different data-, reset-, clock-, and power supply-line lengths has been tested. The susceptibility of the tested microcontroller devices was in general much influenced by clock-, reset-, and power supply-line length, little influenced by data-line length. Further the line length was increased the malfunction threshold was decreased as expected, because more energy couples to the devices. The tested results expect to be applied to the fundamental data which interprets the combination mechanism of the semiconductors from artificial microwave environment. Keyword : High power electromagnetic (HPEM), microcontroller, malfunction, destruction, coupling effect