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Thermal Modeling of Power Semiconductor Based on Loss-Temperature Data Measurement
- Jeong, Hyeonho;
- Choi, Seung-Woo;
- Yoo, Jiwon;
- Lim, Dong-Hyun
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0초록
This paper proposes a method for estimating the thermal impedance of power semiconductors using precisely controlled conduction losses. The designed conduction loss generator applies sinusoidal losses with accurate frequency and phase, and the temperature response of power semiconductor is measured for the thermal model estimation. The proposed method enables loss-temperature impedance extraction in the frequency domain, which can be converted to the well-known Foster thermal network. © 2025 Korean Institute of Electrical Engineers Electrical Machinery and Energy Conversion Systems Society.
키워드
Conduction loss; nonlinear least square method; power semiconductor; sensor delay compensation; thermal model network
- 제목
- Thermal Modeling of Power Semiconductor Based on Loss-Temperature Data Measurement
- 저자
- Jeong, Hyeonho; Choi, Seung-Woo; Yoo, Jiwon; Lim, Dong-Hyun
- 발행일
- 2025
- 유형
- Conference paper
- 저널명
- ICEMS 2025 - 28th International Conference on Electrical Machines and Systems
- 페이지
- 2987 ~ 2991