KrF 엑시머 레이저에 의한 ITO 박막의 어블레이션과 표면특성관찰

초록

This work aimed to develop ITO (Indium Tin Oxide) thin films ablation with a KrF Eximer laser required for the application in flat panel display, especially patterning into small geometry on a large substrate area. The threshold fluence for ablating ITO on glass substrate is about 0.1 J/㎠. And its value is much smaller than using third harmonic Nd:YAG laser. Through the optical microscope measurement the surface color of the damaged ITO is changed into dark brown and the irradiated spot is completely isolated from the undamaged surroundings by laser light. The XPS analysis showed that the relative surface concentration of Sn and In were essentially unchanged (In:Sn=5:1) after irradiating Eximer laser. Using aluminum mask made by second harmonic Nd:YAG laser the ITO patterning is carried out.