Formation of a Polycrystalline Silicon Thin Film by Using Blue Laser Diode Annealing

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초록

We report the crystallization of an amorphous silicon thin film deposited on a SiO2/Si wafer using an annealing process with a high-power blue laser diode (LD). The laser annealing process was performed using a continuous-wave blue LD of 450 nm in wavelength with varying laser output power in a nitrogen atmosphere. The crystallinity of the annealed poly-silicon films was investigated using ellipsometry, electron microscope observation, X-ray diffraction, and Raman spectroscopy. Polysilicon grains with > 100-nm diameter were observed to be formed after the blue LD annealing. The crystal quality was found to be improved as the laser power was increased up to 4 W. The demonstrated blue LD annealing is expected to provide a low-cost and versatile solution for lowtemperature poly-silicon processes.

키워드

Laser annealingLow-temperature poly-siliconCrystallizationBlue laserCRYSTALLIZATIONTRANSISTORSSIO2
제목
Formation of a Polycrystalline Silicon Thin Film by Using Blue Laser Diode Annealing
저자
Choi, Young-HwanRyu, Han-Youl
DOI
10.3938/jkps.72.939
발행일
2018-04
유형
Article
저널명
Journal of the Korean Physical Society
72
8
페이지
939 ~ 942