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Investigation on Breakdown Performance of 0.35 um LDMOS Devices

  • WON TAEYOUNG
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Investigation on Breakdown Performance of 0.35 um LDMOS Devices
저자
WON TAEYOUNG
학회명
The 7th International conference on advanced Materials and Devices
개최지
Ramada Plaza Jeju Hotel
학회 개최일
2011-12-07 ~ 2011-12-09

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