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초록
We discussed on behaviors of carrier in OLED device which has the thin CuPc layer for hole injection layer (HIL). We used Alq3 (Tris (8- hyroxyquinolinato) aluminium) for electron transfer layer, S-DPVBi (4,4'-bis (2,2'- diphenylvinyl) -1,1'- spirobiphenyl) for Emission layer and S-TAD (2,2′,7,7′-tetrakis-(N,N-diphenylamino)-9,9′-spirobifluoren) for hole transfer layer.
- 제목
- Computational study on Behaviors of Carrier in OLED devices with thin CuPc layer
- 저자
- WON TAEYOUNG
- 학회명
- The 21st Korean Conference on Semiconductors
- 개최지
- Hanyang University
- 학회 개최일
- 2014-02-24 ~ 2014-02-26