Computational study on Behaviors of Carrier in OLED devices with thin CuPc layer

  • WON TAEYOUNG

초록

We discussed on behaviors of carrier in OLED device which has the thin CuPc layer for hole injection layer (HIL). We used Alq3 (Tris (8- hyroxyquinolinato) aluminium) for electron transfer layer, S-DPVBi (4,4'-bis (2,2'- diphenylvinyl) -1,1'- spirobiphenyl) for Emission layer and S-TAD (2,2′,7,7′-tetrakis-(N,N-diphenylamino)-9,9′-spirobifluoren) for hole transfer layer.

제목
Computational study on Behaviors of Carrier in OLED devices with thin CuPc layer
저자
WON TAEYOUNG
학회명
The 21st Korean Conference on Semiconductors
개최지
Hanyang University
학회 개최일
2014-02-24 ~ 2014-02-26