A High-speed Wireless Data Transfer for Non Destructive Testing

  • Dangba, Hanh
  • Bui-ngoc, Thang
  • Kim, Hae-jin
  • Song, Jun-hee
  • Chung, Chaiyoon
  • ... Byun, Gyung-Su
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초록

This paper presents a sub-THz wireless data transfer (WDT) design for low-power chip-to-chip communication using on-off keying (OOK) modulation scheme. Input baseband data is modulated with a 90-GHz clock signal, which is generated by the proposed near-threshold voltage-controlled oscillator. The modulated signal is transferred through an air media by using the proposed inductive coupler. Since the sub-THz frequency band is utilized, a data rate of 10 Gb/s could be achieved while the chip size is only 0.2 mm(2) and 0.3 mm(2) for transmitter and receiver, respectively. The proposed WDT design consumes only 15 mW power from a 1-V supply.

키워드

Wireless data transferWDTwafer-level testing
제목
A High-speed Wireless Data Transfer for Non Destructive Testing
저자
Dangba, HanhBui-ngoc, ThangKim, Hae-jinSong, Jun-heeChung, ChaiyoonByun, Gyung-Su
DOI
10.1109/ISOCC53507.2021.9613878
발행일
2021
유형
Proceedings Paper
저널명
18TH INTERNATIONAL SOC DESIGN CONFERENCE 2021 (ISOCC 2021)
페이지
315 ~ 316