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A High-speed Wireless Data Transfer for Non Destructive Testing
- Dangba, Hanh;
- Bui-ngoc, Thang;
- Kim, Hae-jin;
- Song, Jun-hee;
- Chung, Chaiyoon;
- ... Byun, Gyung-Su
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0초록
This paper presents a sub-THz wireless data transfer (WDT) design for low-power chip-to-chip communication using on-off keying (OOK) modulation scheme. Input baseband data is modulated with a 90-GHz clock signal, which is generated by the proposed near-threshold voltage-controlled oscillator. The modulated signal is transferred through an air media by using the proposed inductive coupler. Since the sub-THz frequency band is utilized, a data rate of 10 Gb/s could be achieved while the chip size is only 0.2 mm(2) and 0.3 mm(2) for transmitter and receiver, respectively. The proposed WDT design consumes only 15 mW power from a 1-V supply.
키워드
Wireless data transfer; WDT; wafer-level testing
- 제목
- A High-speed Wireless Data Transfer for Non Destructive Testing
- 저자
- Dangba, Hanh; Bui-ngoc, Thang; Kim, Hae-jin; Song, Jun-hee; Chung, Chaiyoon; Byun, Gyung-Su
- 발행일
- 2021
- 유형
- Proceedings Paper
- 저널명
- 18TH INTERNATIONAL SOC DESIGN CONFERENCE 2021 (ISOCC 2021)
- 페이지
- 315 ~ 316