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“Smart” TDDB Algorithm for Investigating Degradation in High-κ Gate Dielectric Stacks under Constant Voltage Stress
- 제목
- “Smart” TDDB Algorithm for Investigating Degradation in High-κ Gate Dielectric Stacks under Constant Voltage Stress
- 저자
- RINO CHOI
- 학회명
- 4th International Symposium on Advanced Gate Stack Technology