Optical Low-coherence Reflectometric Measurement of the Propagation Characteristics of Optical-printed Circuit Board

  • PARK SEGEUN

초록

The measurement system based on optical low- coherence reflectometry (OLCR) was constructed to characterize propagation characteristics of optical printed circuit board (O-PCB), and the sensitivity of the system was improved by applying the noise-reduction techniques such as the balanced detection scheme and the signal modulation method.

제목
Optical Low-coherence Reflectometric Measurement of the Propagation Characteristics of Optical-printed Circuit Board
저자
PARK SEGEUN
학회명
OECC 2005, Technical Digest of the 10th OptoElectronics and Communication Conference