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A measurement method of nonradiative carrier lifetime in InGaN/GaN quantum wells by time-resolved photoluminescence
- 제목
- A measurement method of nonradiative carrier lifetime in InGaN/GaN quantum wells by time-resolved photoluminescence
- 저자
- RYU HANYOUL
- 학회명
- Asia-Pacific Workshop on Widegap Semiconductors
- 개최지
- Toba hotel, Toba, Mie
- 학회 개최일
- 2011-05-22 ~ 2011-05-26