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Measurement of propagation characteristics of curved waveguides using Near-field Scanning Optical Microscopy

Measurement of propagation characteristics of curved waveguides using Near-field Scanning Optical Microscopy
제목
Measurement of propagation characteristics of curved waveguides using Near-field Scanning Optical Microscopy
제목 (타언어)
Measurement of propagation characteristics of curved waveguides using Near-field Scanning Optical Microscopy
저자
O BEOM HOAN
학회명
Technical Digest of the 9th OptoElectronics and Communication Conference

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