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A Measurcment Method of Internal Quantum Efrciency in InGaN-Based Quantum Well Structure by Intensity Dependent Photoluminescence
- 제목
- A Measurcment Method of Internal Quantum Efrciency in InGaN-Based Quantum Well Structure by Intensity Dependent Photoluminescence
- 저자
- RYU HANYOUL
- 학회명
- The 8th International Conference on Nitride Semiconductors
- 개최지
- ICC Jeju
- 학회 개최일
- 2009-10-18 ~ 2009-10-23