Solution-Processed Rb-Doped Indium Zinc Oxide Thin-Film Transistors

  • Kim, Sang-Woo; 
  • Manh-Cuong Nguyen; 
  • An Hoang-Thuy Nguyen; 
  • Choi, Su-Jin; 
  • Ji, Hyung-Min; 
  • ... Choi, Rino; 
  • 외 4명
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초록

Rubidium-doped indium zinc oxide thin film transistors (TFTs), including zirconium oxide gate dielectrics and In-Zn-O (IZO) channel deposition, were fabricated using a solution process. Electrical characteristics of Rb-doped IZO TFTs were improved significantly because of crystallinity enhancement with Rb doping. The optimal Rb-doping concentration to reach the highest field-effect mobility, ON/OFF current ratio, and a subthreshold slope were obtained at an Rb-doping concentration of 2 moles %. Compared with Li doping, Rb-doped IZO transistors exhibited less change of threshold voltage under bias stress.

키워드

Solution process; thin film transistors; doping; rubidium; In-Zn-O; ELECTRICAL-PROPERTIES; ZNO TRANSISTORS; ELECTRONICS; AIR
제목
Solution-Processed Rb-Doped Indium Zinc Oxide Thin-Film Transistors
저자
Kim, Sang-Woo; Manh-Cuong Nguyen; An Hoang-Thuy Nguyen; Choi, Su-Jin; Ji, Hyung-Min; Cheon, Jong-Gyu; Yu, Kyoung-Moon; Kim, Jin-Hyun; Cho, Seong-Yong; Choi, Rino
DOI
10.1109/LED.2018.2862418
발행일
2018-09
유형
Article
저널명
IEEE Electron Device Letters
권
39
호
9
페이지
1330 ~ 1333