ScholarWorks@인하대학교

상세 보기

Characteristics of Grain Boundary Traps in Polysilicon Channel Thin Film Transistors

제목
Characteristics of Grain Boundary Traps in Polysilicon Channel Thin Film Transistors
저자
RINO CHOI
학회명
제20회 한국반도체학술대회

ScholarWorks@인하대학교

22212 인천광역시 미추홀구 인하로 100 정석학술정보관 Tel. 032-860-9003

COPYRIGHT © 인하대학교 All Rights Reserved.

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.

You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.