Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/f Corner for DC Measurement Applications (vol 74, pg 1, 2025)

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Performance evaluationFEEDBACK INSTRUMENTATION AMPLIFIERGAIN ERRORDELTAOFFSETNOISECMOSADCINL
제목
Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/f Corner for DC Measurement Applications (vol 74, pg 1, 2025)
저자
Kang, JunhoHan, WoosolKim, SuhwanJun, Jaehoon
DOI
10.1109/TIM.2025.3561610
발행일
2025
유형
Correction
저널명
IEEE Transactions on Instrumentation and Measurement
74