대기압플라즈마를 이용한 감광제 제거공정에 관한 연구

  • LEE EL HANG

초록

Ashing of photoresist was investigated in dielectric barrier discharges in atmospheric pressure by changing applied voltage, frequency, flow rate. We analyzed the plasma by Optical Emission Spectroscopy (OES) to monitor the variation of active oxygen species. Another new peaks of oxygen radical is observed by addition of argon gas. This may explain the increase in ashing rate with argon addition. With the results of OES, we can find the optimized ashing conditions.

제목
대기압플라즈마를 이용한 감광제 제거공정에 관한 연구
저자
LEE EL HANG
학회명
한국반도체산업협회, 한국반도체학술대회, 2004년 02월