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초록
This paper examines the malfunction of computers with coupling caused by high power microwaves. The RADAN was employed to study the susceptibility of High Power Electromagnetis on computers. Malfunction of computers was observed through the monitor. In study tested effect on the direction of the incident High Power Electromagnetics and the vents of varying sizes. Malfunction of computers was occurred in the electric field strength over 10 kV/m. Computer was most vulnerable when the direction of High Power Electromagnetics was in front of computer. In addition, the effect of the vent area was a little. Based on the results, computers can be applied to database to elucidate the effects of microwaves on electronic equipment.
- 제목
- 광대역 고출력 전자기파에 의한 컴퓨터의 민감성 분석
- 제목 (타언어)
- Analysis of Computer Susceptibility Affected by UWB - High Power Electromagnetics
- 저자
- HUH CHANG SU
- 학회명
- 국방과학연구소 창설 40주년 기념 종합학술대회
- 개최지
- 대전컨벤션센터(DCC)
- 학회 개최일
- 2010-08-02 ~ 2010-08-04