Susceptibility of TTL Logic Devices to Narrow-band High Power Electromagnetic Threats

초록

The aim of this paper is to investigate the damage effects of TTL AND and NANd logic devices manufactured using five different technologies under narrow-band high power electromagnetic (NB-HPEM) waves by magnetron. the output of the magnetron was controlled from 0 to 1kW and the operating frequency was narrow-band at 2460Mhz.