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Improved Flash Memory Program and Erase Window with TiO2 Charge Trap Layer and High Temperature Dopant Activation Anneal
- 제목
- Improved Flash Memory Program and Erase Window with TiO2 Charge Trap Layer and High Temperature Dopant Activation Anneal
- 저자
- RINO CHOI
- 학회명
- 4th International Symposium on Advanced Gate Stack Technology