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Evolution of Channel Trap Distribution under Bias Stress in Polysilicon Thin Film Transistors evaluated by Charge Pumping Method
- 제목
- Evolution of Channel Trap Distribution under Bias Stress in Polysilicon Thin Film Transistors evaluated by Charge Pumping Method
- 저자
- RINO CHOI
- 학회명
- 2012 IEEE Silicon Nanoelectronics Workshop
- 학회 개최일
- 2012-06-10 ~ 2012-06-11