Effect of Multiple Reflow Processes on the Reliability and Microstructure of Sn-Ag-Cu-In Solder Joint

Effect of Multiple Reflow Processes on the Reliability and Microstructure of Sn-Ag-Cu-In Solder Joint
  • KIM MOK SOON

초록

The authors have previously reported that the quaternary Sn-1.2Ag-0.7Cu-0.4In(wt%) alloy showed excellent wettability and mechanical reliability. Moreover, the addition of small amount of Pd or Mn was considered to improve its reliability to a greater extent especially in drop impact condition. In this study, the effect of multiple reflow processes on the drop impact reliability and microstructure of Sn-1.2Ag-0.7Cu-0.4In-X solder joints was investigated. The test package was prepared with OSP (organic solderability preservative)/Cu finished FR-4 PCD and ENIG finished BGA package. After the first reflow, the samples were repeated reflow of 3 and 5 cycles. The drop impact reliability tests were performed in a various ways and the results were compared with those of Sn-1.0Ag-0.5Cu and Sn-3.0Ag-0.5Cu alloys. The microstructure and partitioning of alloying elements in the solder joint were analyzed using SEM, EDS, XRD, EPMA and XPS.

제목
Effect of Multiple Reflow Processes on the Reliability and Microstructure of Sn-Ag-Cu-In Solder Joint
제목 (타언어)
Effect of Multiple Reflow Processes on the Reliability and Microstructure of Sn-Ag-Cu-In Solder Joint
저자
KIM MOK SOON
학회명
TMS2011
개최지
San Diego Convention Center, San Diego, California, USA
학회 개최일
2011-02-27 ~ 2011-03-03