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Micro-size damage detection of multi-layer ceramic capacitors based on Hilbert-Huang transform of electromechanical responses
- 제목
- Micro-size damage detection of multi-layer ceramic capacitors based on Hilbert-Huang transform of electromechanical responses
- 저자
- Howuk Kim
- 학회명
- SPIE Smart Structures + Nondestructive Evaluation 2024
- 개최지
- 미국 (Long Beach)
- 학회 개최일
- 2024-03-25 ~ 2024-03-25