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Bias dependence of PBTI degradation mechanism in metal-oxide-semiconductor field effect transistors with La-incorporated hafnium-based dielectric
- 제목
- Bias dependence of PBTI degradation mechanism in metal-oxide-semiconductor field effect transistors with La-incorporated hafnium-based dielectric
- 저자
- RINO CHOI
- 학회명
- 17th Conference on "Insulating Films on Semiconductors"