Measurement of propagation characteristics of curved waveguides using Near-field Scanning Optical Microscopy

  • LEE EL HANG

초록

We observed experimentally the lateral shift of the guided mode propagating along the curved waveguide by using near-field scanning optical microscope, and compared the numerical results with the experimental results.

제목
Measurement of propagation characteristics of curved waveguides using Near-field Scanning Optical Microscopy
저자
LEE EL HANG
학회명
OECC/COIN2004 (Yokohama, Japan), Technical Digest of the 9th OptoElectronics and Communication Conference