Characteristics of SiOxNy thin films prepared by ion beam assisted deposition

이온빔보조증착을 이용한 SiOxFy 박막의 특성
  • CHANG KWON HWANGBO

초록

Optical, chemical, and mechanical properties of fluorine-doped SiO2(SiOxFy) films prepared by ion-beam-assisted deposition are investigated to utilize them as a low-index material.

제목
Characteristics of SiOxNy thin films prepared by ion beam assisted deposition
제목 (타언어)
이온빔보조증착을 이용한 SiOxFy 박막의 특성
저자
CHANG KWON HWANGBO
학회명
1999 OSA Technical Digest Series, Optical Interference Coatings