Materials analysis by advanced transmission electron microscopy

초록

Observing and characterizing the microstructures on a nanometer scale are of vital importance for understanding material property and its application to engineering. In this talk, with high precision in space, I introduce recent studies on nanoscale materials and devices by using advanced techniques in transmission electron microscopy (TEM). Pin-point analyses at interfaces and boundaries in a Heusler alloy (Ni-Mn-Al-Ga)[1] are TMR spin valve head (nano-heterostructure)[2] are presented. Secondly, I show the observation of the magnetic flux and three-dimensional (3D) structure of skyrmion lattices in a Fe-Co-Si helimagnet[3] and discuss the importance of TEM studies in materials. Lastly, recent studies on Ti and TiO2 nano-sized particles fabricated by pulsed wire evaporation method will be presented. These studies demonstrate the promise of TEM techniques not only for real-space, in situ quantitative imaging, but also for pin-point analysis to tackle problems in materials science and engineering.