Prediction of EMP Effects on IC component Using the BLT Equation

초록

This paper discusses the computational prediction of effects on IC component due to electromagnetic pulse penetration and coupling on PCB strip lines. The main effect of EMP on IC is 'coupling' on line attached IC and coupled abnormal voltage or current are injected to IC [1]. Analyzing and evaluating the EMP coupling on line is important work to predict IC components from EMP attacks [1]. If the coupled abnormal voltage or current are injected, malfunction or destruction are occurred in IC. The interactions and coupling between the external source and the strip lines of PCB were calculated with computational simulation using the BLT equation [2]. To make the BLT equation suitable for the PCB condition, the characteristic impedance and other characteristic constants are calculated. And the used IC component was modeled as RLC load to set up the BLT equation [3]. To show that the simulation results are reliable, the commercial computer simulation software were used and compared with. Voltages and Currents of each pins of the semiconductor were compared and discussed. The errors between the calculations by commercial computer simulation software and the BLT method are 3%~5%. Acknowledgments This work has been supported by ADD (Agency for Defense Development) and DAPA (Defense Acquisition Program Administration) References 1. M. Camp, F. Sabath, "Coupling of Transient Ultra Wide Band Electromagnetic Fields to Complex Electronic Systems", 2005 International Symposium on Electromagnetic Compatibility, 2005. 2. F. M. Tesche, M. Ianoz, and T. Karlsson, EMC Analysis methods and computational models. New York: Wiley Interscience, 1997. 3. Marco. Leone, "Radiated Susceptibility on the Printed-Circuit-Board Level: Simulation and Measuremen", IEEE Trans. Electromagn. Compat., vol. 47, no. 3, pp. 471478, Aug. 2005.