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NSOM을 이용한 곡선형 광 도파로 도파 특성 측정
The Measurement of waveguide characterization of curved waveguide using Near-field Scanning Optical Microscopy
초록
We measured evanescent field of light which progress in straight line style optical waveguide and curved line style optical waveguide. Specially, measure evanescent field's maximum point transfer phenomenon by curved line style optical waveguide and compared with theoretical result
- 제목
- NSOM을 이용한 곡선형 광 도파로 도파 특성 측정
- 제목 (타언어)
- The Measurement of waveguide characterization of curved waveguide using Near-field Scanning Optical Microscopy
- 저자
- O BEOM HOAN
- 학회명
- Photonic Conference 2003