Investigation of Grain Boundary Features in Semiconducting Oxides by Transmission Electron Microscopy

초록

Semiconducting SrTiO3 ceramics were prepared by sintering the green bodies of SrTiO3 at 1400oC in a reducing atmosphere. These ceramics were crushed mechanically, and then semiconducting SrTiO3 powders with a diameter ranging from 1 to 10 micrometers were obtained by sedimentation and sieving methods. The chemical and structural features of the grain boundary of the ceramics were examined using a transmission electron microscope with an energy dispersive spectroscopy facility; an electron beam probe with a diameter of 2 nm was applied for the EDS analysis.