Strategy for Low Temperature HZO Ferroelectric Capacitors for Back-End of Line Applications

  • Kim, Jin-Hyun
  • Lee, Minjong
  • Lee, Seojun
  • Jung, Yong Chan
  • Choi, Rino
  • 외 3명
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초록

In this report, we discuss methods for obtaining the orthorhombic phase in hafnia-based materials, a necessary condition for the emergence of ferroelectricity. Those methods, including stress engineering with a top electrode, high-pressure annealing, and physical/chemical densification through controlled deposition conditions, can be performed at temperatures suitable for integration into BEOL 3D structures and flexible, wearable technologies. By successfully implementing these techniques, hafnia-based ferroelectric materials can be utilized in a variety of advanced applications.

키워드

Low temperatureHf0.5Zr0.5O2Atomic layer depositionFerroelectricBack-end-of-line
제목
Strategy for Low Temperature HZO Ferroelectric Capacitors for Back-End of Line Applications
저자
Kim, Jin-HyunLee, MinjongLee, SeojunJung, Yong ChanChoi, RinoKim, Hyun JaeKim, Si JoonKim, Jiyoung
DOI
10.1109/EDTM55494.2023.10103066
발행일
2023
유형
Proceedings Paper
저널명
2023 7TH IEEE ELECTRON DEVICES TECHNOLOGY & MANUFACTURING CONFERENCE, EDTM