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Strategy for Low Temperature HZO Ferroelectric Capacitors for Back-End of Line Applications
- Kim, Jin-Hyun;
- Lee, Minjong;
- Lee, Seojun;
- Jung, Yong Chan;
- Choi, Rino;
- 외 3명
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2초록
In this report, we discuss methods for obtaining the orthorhombic phase in hafnia-based materials, a necessary condition for the emergence of ferroelectricity. Those methods, including stress engineering with a top electrode, high-pressure annealing, and physical/chemical densification through controlled deposition conditions, can be performed at temperatures suitable for integration into BEOL 3D structures and flexible, wearable technologies. By successfully implementing these techniques, hafnia-based ferroelectric materials can be utilized in a variety of advanced applications.
키워드
Low temperature; Hf0.5Zr0.5O2; Atomic layer deposition; Ferroelectric; Back-end-of-line
- 제목
- Strategy for Low Temperature HZO Ferroelectric Capacitors for Back-End of Line Applications
- 저자
- Kim, Jin-Hyun; Lee, Minjong; Lee, Seojun; Jung, Yong Chan; Choi, Rino; Kim, Hyun Jae; Kim, Si Joon; Kim, Jiyoung
- 발행일
- 2023
- 유형
- Proceedings Paper
- 저널명
- 2023 7TH IEEE ELECTRON DEVICES TECHNOLOGY & MANUFACTURING CONFERENCE, EDTM