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Investigation on Breakdown Performance of 0.35 um LDMOS Process

  • WON TAEYOUNG
제목
Investigation on Breakdown Performance of 0.35 um LDMOS Process
저자
WON TAEYOUNG
학회명
The 15th International Symposium on the Physical of Semiconductors and Applications
개최지
Jeju Ramada Hotel
학회 개최일
2011-07-05 ~ 2011-07-08

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