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초록
Abstract: We measured evanescent field of light which progress in straight line style optical waveguide and curved line style optical waveguide. Specially, measure evanescent field's maximum point transfer phenomenon by curved line style optical waveguide and compared with theoretical result
- 제목
- 근접장 주사광학현미경을 이용한 곡선형 광 도파로 도파 특성 측정
- 제목 (타언어)
- The Measurement of waveguide characterization of curved waveguide using Near-field Scanning Optical Microscopy
- 저자
- PARK SEGEUN
- 학회명
- 한국광학회, Photonic Conference 2003