이영우 프로필 사진

이영우

LEE, YOUNG WOO

단과대학

공과대학

반도체시스템공학과

Scopus ORCID

자료 필터

자료유형

발행연도

2018 ~ 2026
2018 2026

키워드

언어

선택된 필터

  • article
  • book

전체 23건 중 11번부터 20번까지의 결과를 표시합니다.

2024
Article

Machine Learning-Based Vehicle Classification Using Electromagnetic Leakage Signals

  • 2024
  • ISAP 2024 - International Symposium on Antennas and Propagation
  • Institute of Electrical and Electronics Engineers Inc.
Article

Optimized Instruction Set Architecture for Programmable Memory Test Pattern Generation

  • 2024
  • Proceedings - International SoC Design Conference 2024, ISOCC 2024
  • Institute of Electrical and Electronics Engineers Inc.
Article

Production-Oriented Design for High Parallel Test Efficiency

  • 2024
  • Proceedings - International SoC Design Conference 2024, ISOCC 2024
  • Institute of Electrical and Electronics Engineers Inc.
2023
Article

Timestamp-Based Secure Shield Architecture for Detecting Invasive Attacks

  • 2023-09
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
  • Institute of Electrical and Electronics Engineers
2022
Article

Row Hammer Reduction Using a Buried Insulator in a Buried Channel Array Transistor

  • Park, Jin Hyo ; 
  • Kim, Su Yeon ; 
  • Kim, Dong Young ; 
  • Kim, Geon ; 
  • Park, Je Won ; 
  • ... Lee, Young-Woo ; 
  • 외 2명
  • 2022-12
  • IEEE Transactions on Electron Devices
  • Institute of Electrical and Electronics Engineers
Article

Reduced-Pin-Count BOST for Test-Cost Reduction

  • 2022-03
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Institute of Electrical and Electronics Engineers
Article

4-Pole Hybrid HVDC Circuit Breaker for Pole-to-Pole (PTP) Fault Protection

  • Kim, Geon ; 
  • Park, Jin Hyo ; 
  • Kim, Dong Yeong ; 
  • Kim, Su Yeon ; 
  • Kim, Tae-Hoon ; 
  • ... Lee, Young-Woo ; 
  • 외 2명
  • 2022
  • IEEE Access
  • Institute of Electrical and Electronics Engineers Inc.
2020
Article

Robust Secure Shield Architecture for Detection and Protection Against Invasive Attacks

  • 2020-10
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
  • Institute of Electrical and Electronics Engineers
Article

Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing

  • 2020-08
  • IEEE Transactions on Semiconductor Manufacturing
  • Institute of Electrical and Electronics Engineers
2019
Article

A low-cost concurrent TSV test architecture with lossless test output compression scheme

  • Lee, Young-woo ; 
  • Lim, Hyunchan ; 
  • Seo, Sungyoul ; 
  • Cho, Keewon ; 
  • Kang, Sungho
  • 2019-08-23
  • PLoS One
  • PUBLIC LIBRARY SCIENCE