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자료 필터
자료유형
발행연도
2018 ~ 2026
2018 2026
키워드
언어
선택된 필터
- article
- book
전체 23건 중 1번부터 10번까지의 결과를 표시합니다.
2026
Article
Optimized fault-tolerant data processing module for high-reliability CNN accelerator
- Yoon, Sung-Kwang ;
- Lee, Seung-Han ;
- Jo, Juhyeong ;
- Lee, Young-woo
- 2026-02-27
- PLoS One
- PUBLIC LIBRARY SCIENCE
Article
Scalable Multi-Site Test Architecture for Chiplet-Based Systems on ATE Platforms
- Shin, Jae Hwan ;
- Kim, Hyunbeen ;
- Park, Jin Hwan ;
- Lee, Young-Woo
- 2026-02
- IEEE Transactions on Semiconductor Manufacturing
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
A New Dual-Engine Error Recovery Scheme for High-Reliability HBM
- Kim, Keonwoo ;
- Min, Heonjun ;
- Park, Jungin ;
- Lee, Young-Woo
- 2026
- International Conference on Ubiquitous and Future Networks, ICUFN
- IEEE Computer Society
Article
WTM-Aware Shift Direction Selection for Low Power Bidirectional Scan Testing
- Kim, Donghyun ;
- Park, Juhyun ;
- Park, Jungin ;
- Lee, Young-Woo
- 2026
- International Conference on Ubiquitous and Future Networks, ICUFN
- IEEE Computer Society
2025
Article
Error-Correction Circuit based PUF Structure for High Reliability SSN
- Choi, Byeongmin ;
- Yoon, Sungkwang ;
- Im, Taeuk ;
- Park, Jin Hwan ;
- Sung, Minsuk ;
- ... Lee, Young-Woo
- 2025
- 2025 IEEE/IEIE International Conference on Consumer Electronics-Asia, ICCE-Asia 2025
- Institute of Electrical and Electronics Engineers Inc.
Article
Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip
- Lee, Seung-Han ;
- Park, Jin Hwan ;
- Lee, Young-Woo
- 2025
- IEEE Access
- Institute of Electrical and Electronics Engineers Inc.
Article
A Self-Recovery Scheme for Fault-Tolerant and Side-Channel Resistant Systolic Arrays
- Bang, Chanhyeok ;
- Yoon, Sungkwang ;
- Lee, Youngwoo
- 2025
- 2025 International Technical Conference on Circuits/Systems, Computers, and Communications, ITC-CSCC 2025
- Institute of Electrical and Electronics Engineers Inc.
Article
A Two-Phase Test Point Insertion Scheme for Low-Power Scan Testing
- Lee, Seongjin ;
- Kim, Hyunbeen ;
- Jung, Sunghun ;
- Park, Jin Hwan ;
- Sung, Minsuk ;
- ... Lee, Young-Woo
- 2025
- 2025 IEEE/IEIE International Conference on Consumer Electronics-Asia, ICCE-Asia 2025
- Institute of Electrical and Electronics Engineers Inc.
Article
SDC-aware Masking Scheme for Biased SEUs and Directional Bit-Flipping
- Jo, Juhyeong ;
- Shin, Jaehwan ;
- Lee, Youngwoo
- 2025
- 2025 International Technical Conference on Circuits/Systems, Computers, and Communications, ITC-CSCC 2025
- Institute of Electrical and Electronics Engineers Inc.
2024
Article
비트맵 데이터 학습을 통한 딥러닝 기반의 메모리 수리 예측 기술 연구
- 이영우 ;
- 강유진 ;
- 오준석 ;
- 서은솔 ;
- 박석민
- 2024-10
- 디지털콘텐츠학회논문지
- 한국디지털콘텐츠학회