금대명 프로필 사진

금대명

GEUM, DAEMYEONG

공과대학

전기전자공학부

자료유형

발행연도

2024 ~ 2026
2024 2026

키워드

언어

전체 37건 중 1번부터 10번까지의 결과를 표시합니다.

2026
Article

Comprehensive study of current-density-dependent degradation in AlGaInP/GaInP based red micro-LEDs (vol 90, 109167, 2026)

  • 2026-07
  • SURFACES AND INTERFACES
  • ELSEVIER
Article

Comprehensive study of current-density-dependent degradation in AlGaInP/GaInP based red micro-LEDs

  • 2026-06
  • SURFACES AND INTERFACES
  • ELSEVIER
Article

Thermo-mechanical reliability and scalability of copper-pillar solder-cap interconnects for micro-LEDs

  • Kim, Junhyeock
  • Jeong, Ho-Jung
  • Geum, Dae-Myeong
  • Oh, Yong Suk
  • Park, Min-Su
  • 외 3명
  • 2026-04
  • Microelectronics and Reliability
  • PERGAMON-ELSEVIER SCIENCE LTD
Article

Implementation of enhancement-mode InGaAs/InAlAs HEMTs by hole delta-doping in a buffer-layer: A simulation study

  • Han, Songyi
  • Woo, Jeong-Min
  • Oh, Byungjun
  • Byun, Woosub
  • Park, Min-Su
  • ... Geum, Dae-Myeong
  • 2026-04
  • Current Applied Physics
  • ELSEVIER
Article

Deuterium-enabled stabilization of metal/oxide interfaces via suppressed oxygen diffusion in BEOL-compatible InGaZnO thin-film transistors

  • Byun, Woosub
  • Kil, Tae-Hyun
  • Kim, Bong Ho
  • Kim, Yunseok
  • Park, Hwanyeol
  • ... Geum, Dae-Myeong
  • 외 1명
  • 2026-04
  • Journal of Materials Chemistry C
  • ROYAL SOC CHEMISTRY
Article

Quantitative analysis of substrate effects on thermal characteristics in InGaN/GaN-based micro-LEDs

  • Kang, Yeonbin
  • Jeong, Ho-Jung
  • Byun, Woosup
  • Han, Songyi
  • Kang, Chang-Mo
  • ... Geum, Dae-Myeong
  • 2026-02-01
  • Semiconductor Science and Technology
  • IOP Publishing Ltd
Article

A monolithic three-dimensional integrated red micro-LED display on silicon using AlInP/GaInP epilayers

  • Park, Juhyuk
  • Baek, Woojin
  • Kim, Hyunsu
  • Jung, Dongsoon
  • Kim, Hokwon
  • ... Geum, Dae-Myeong
  • 외 12명
  • 2026-02
  • NATURE ELECTRONICS
  • NATURE PORTFOLIO
Article

Recovery Operation in HfZrOx-Based FeFETs With Interfacial Layer Scavenging

  • Kim, Bong Ho
  • Kim, Seong Kwang
  • Kuk, Song-Hyeon
  • Jeong, Jaeyong
  • Park, Youngkeun
  • ... Geum, Dae-Myeong
  • 외 5명
  • 2026-02
  • IEEE Transactions on Electron Devices
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Impact of high-pressure annealing on characteristics of InGaAs/InAlAs metamorphic high-electron mobility transistors

  • Han, Songyi
  • Byun, Woosub
  • Kang, Yeonbin
  • Kil, Tae-Hyun
  • Park, Jun-Young
  • ... Geum, Dae-Myeong
  • 외 4명
  • 2026-01-19
  • Applied Physics Letters
  • AIP Publishing
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